What's new!
  • The Award Winners of Best Paper have been announced.
    Congratulations!!!
  • Thank you for visiting Photomask Japan 2009.
    Photomask Japan 2010 will be held in 13-15 April 2010 and Technical Exhibition will be held in 13-14 April 2010 at Pacifico Yokohama.
    We look forward to seeing you at the next edition!
  • Photomask Japan 2009 Results
    Symposium Attendees 319
    Visitors to Exhibition only 219


Photomask Japan 2009 is the 16th international symposium on photomasks and NGL masks in Japan. The aim of the symposium is to bring together engineers and investigators from Japan, USA, and all over the world in the field of photomasks, NGL masks, and related technologies to discuss recent progress, applications, and future trends. The conference program will feature invited papers, contributed papers, poster sessions, and a rump session with panel discussion. Display opportunities will be provided to mask manufacturing materials, and equipment companies.

Topics
 
  • Materials of and for Photomasks
  • Fabrication Process Steps and Equipments for Photomasks
    (process and equipments for developing, etching, cleaning etc.)
  • Photomask Writing Tools and Technologies
  • Metrology Tools and Technologies
  • Inspection Tools and Technologies
  • Repairing Tools and Technologies
  • Mask Data Preparations
  • EDA and DFM for Photomask
  • Photomasks with RET: PSM, Masks with OPC
  • Photomask-relating Lithography Technologies
  • NGL Masks: EUV, Nano-imprint ML2 etc.
  • Mask Strategies and Business Challenges: Cost, Cycle-Time etc.